On Activity Dips of AT Crystals at High Level of Drive

• 1 January 1967
• proceedings article
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 436-454
• https://doi.org/10.1109/freq.1967.199682

Abstract

Keywords

• ELECTRONICS PACKAGING
• CRYSTALS
• FLANGES
• DRIVES
• IEC STANDARDS
• VOLTAGE
• FREQUENCY MEASUREMENT
• TEMPERATURE
• COUPLING CIRCUITS