Sampling for Oscilloscopes and Other RF Systems: DC Through X-Band
- 23 March 2005
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 66, 191-196
- https://doi.org/10.1109/gmtt.1966.1122555
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Sampling Oscilloscope for Statistically Varying PulsesReview of Scientific Instruments, 1957