Comparison of Auger and SIMS analysis of a thin passive oxide film on iron—25% chromium
- 1 June 1987
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 10 (5) , 259-261
- https://doi.org/10.1002/sia.740100507
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- The quantitative analysis of surfaces by XPS: A reviewSurface and Interface Analysis, 1980
- Quantitative approach of Auger electron spectrometry: I. A formalism for the calculation of surface concentrationsSurface Science, 1977
- A simple model for the dependence of Auger intensities on specimen thicknessSurface Science, 1969