Formation mechanism of secondary ions in fast atom bombardment mass spectrometry
- 1 June 1986
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Processes
- Vol. 70 (2) , 145-152
- https://doi.org/10.1016/0168-1176(86)80045-3
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- The behaviour of aromatic hydrocarbons under fast atom bombardmentJournal of Mass Spectrometry, 1984
- Mechanism of fragmentation of organic molecules during keV particle bombardmentInternational Journal of Mass Spectrometry and Ion Physics, 1983
- Sputtering of organic moleculesInternational Journal of Mass Spectrometry and Ion Physics, 1983
- Fast atom bombardment mass spectrometryAnalytical Chemistry, 1982
- Fast atom bombardment of solids (F.A.B.): a new ion source for mass spectrometryJournal of the Chemical Society, Chemical Communications, 1981