A helium-cooled specimen stage for electron microscopy
- 1 February 1982
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 15 (2) , 184-186
- https://doi.org/10.1088/0022-3735/15/2/010
Abstract
A liquid-helium-cooled double-tilt specimen holder for electron microscopy has been designed, built and operated. It fits a side-entry eucentric goniometer and requires no modification of the microscope. A continuous flow cryostat system has been used, that allows the specimen temperature to be held at any point in the range 35K to room temperature.Keywords
This publication has 2 references indexed in Scilit:
- Application of convergent beam electron diffraction to study the stacking of layers in transition-metal dichalcogenidesPhysica B+C, 1980
- A novel specimen stage permitting high-resolution electron microscopy at low temperaturesJournal of Physics E: Scientific Instruments, 1972