Incident-beam enhancements of Auger electron scattering
- 1 May 1991
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 43 (13) , 11460-11463
- https://doi.org/10.1103/physrevb.43.11460
Abstract
The role of scattering of the incident excitation electrons is examined by use of judiciously chosen scattering geometries that allow for the experimental separation of incident-beam effects and Auger-electron-scattering effects. The scattering of 4-keV incident electrons can result in variations greater than 25% of the Auger electron intensity for scattering from bcc Fe(001). A simple procedure for detecting the presence of incident-beam effects in other systems is given.Keywords
This publication has 13 references indexed in Scilit:
- Surface structure determination with forward focused electronsSurface Science, 1989
- Incident beam effects in medium-energy backscattered electron diffractionPhysical Review B, 1987
- Role of multiple scattering in x-ray photoelectron spectroscopy and Auger-electron diffraction in crystalsPhysical Review Letters, 1987
- Medium-energy backscattered electron diffraction as a probe of elastic strain in epitaxial overlayersPhysical Review B, 1987
- Incident beam effects in angle-resolved Auger electron spectroscopyPhysical Review B, 1986
- Direct observation of elastic strain and relaxation at a metal-metal interface by Auger electron diffraction: Cu/Ni(001)Physical Review B, 1986
- Structural characterization of metal-metal interfaces by intermediate-energy Auger-electron diffractionPhysical Review B, 1985
- Crystallographic incident beam effects in quantitative Auger electron spectroscopySurface Science, 1980
- Étude expérimentale de l'influence de l'angle d'incidence des électrons primaires sur le rendement de l'émission AugerSurface Science, 1974
- As(0001) surfaces: Auger, loss, and photoelectron spectroscopic studiesSurface Science, 1974