Laser Photoelectron Attachment to Molecules in a Skimmed Supersonic Beam: Diagnostics of Weak Electric Fields and Attachment Cross Sections Down to20μeV

Abstract
Combining a tunable single mode laser–atomic beam photoelectron source with a skimmed supersonic beam target we have carried out ultrahigh resolution studies of threshold electron attachment to SF6 molecules. Monitoring SF6 formation around the onset for field ionization of high n Rydberg atoms, residual electric fields are diagnosed and reduced to levels around 0.01 V/m, allowing the first study of free electron attachment cross sections σ(E) for energies down to about 20μeV at energy widths as low as 20μeV. The present results for SF6 production conclusively demonstrate the convergence towards the limiting s-wave attachment behavior σE1/2 at energies below 1 meV.