A critical examination of the assumptions underlying macroscopic transport equations for silicon devices
- 1 April 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 40 (4) , 733-740
- https://doi.org/10.1109/16.202785
Abstract
No abstract availableThis publication has 23 references indexed in Scilit:
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