Calculation of attenuated-total-reflection spectra of surface magnetoplasmons on semiconductors

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Abstract
The three-layer system consisting of coupling prism, gap, and sample has been studied in an external magnetic field to calculate the attenuated-total-reflection spectrum due to surface plasmons. The sample is taken to be a nonpolar or polar semiconductor with free carriers, which becomes an anisotropic dielectric medium when the magnetic field is applied. Dispersion curves for the surface-polariton modes are discussed. Computed reflection spectra are shown for two of the three magnetic-field geometries considered. Computed results are compared with experimental results.