Review of scanning force microscopy
- 1 March 1991
- journal article
- research article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 9 (2) , 431-437
- https://doi.org/10.1116/1.585585
Abstract
We present an overview of scanning force microscopy with applications to electrostatic, magnetostatic, and atomic forces operating in the contact and noncontact mode, and highlight the main achievements in this field.This publication has 0 references indexed in Scilit: