An alternative method for analysing orientation relationships from field-ion microscope images
- 1 June 1972
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 25 (6) , 1505-1509
- https://doi.org/10.1080/14786437208223870
Abstract
An analytical method for working out orientation relationships from field-ion micrographs of bicrystals or two-phase systems is described. From three or more pairs of parallel directions a best fit rotation matrix is calculated by computer. A further procedure leads to an estimate of axis and angle of misorientation together with the uncertainty in the angle of misorientation.Keywords
This publication has 6 references indexed in Scilit:
- Observation of Grain Boundaries with the Field-Ion MicroscopeJournal of Applied Physics, 1970
- A method for indexing field ion micrographsJournal of Scientific Instruments, 1967
- A field-ion microscope study of grain boundaries in ironActa Metallurgica, 1967
- A field ion microscope study of atomic configuration at grain boundariesActa Metallurgica, 1964
- The accurate determination of crystal orientation from field ion micrographsJournal of Scientific Instruments, 1964
- The estimation of an orientation relationshipActa Crystallographica, 1957