An interleaved comb ion deflection gate for m/z selection in time-of-flight mass spectrometry
- 1 January 1996
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 67 (1) , 68-72
- https://doi.org/10.1063/1.1146553
Abstract
Modulation of an ion beam is crucial to several applications in time‐of‐flight (TOF) mass spectrometry, especially for tandem TOF instruments which require selection of a particular precursor m/z (mass to charge) value prior to fragmentation. Here we present a detailed description of an ‘‘interleaved comb’’ ion deflection gate device with suitable electronics which offers a performance advantage over the more commonly used deflection plate devices. We demonstrate unit mass resolution for selection to m/z 167 in the tandem TOF instrument constructed in our laboratory. Calculations suggest that the real time of unit resolution for our experimental arrangement is greater than 300.Keywords
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