Texture, microstructure, and magnetic properties of Fe-Co alloy films formed by sputtering at an oblique angle of incidence
- 15 October 1993
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 74 (8) , 5124-5128
- https://doi.org/10.1063/1.354299
Abstract
A study was made of the structure and magnetic properties of Fe‐Co alloy films produced by dc magnetron sputtering at an oblique angle of incidence. The films obtained in this manner showed uniaxial magnetic anisotropy in the film plane, with an easy axis of magnetization perpendicular to the incident direction of the sputtered particles. The anisotropy field increased with increasing sputtering gas pressure and with increasing Co content at high pressures. The structure of the film surfaces also changed with sputtering Ar gas pressure, and elongated grains were observed in the intermediate Ar pressure range. The texture was essentially isotropic in the film plane over the whole pressure range. It is suggested that the observed uniaxial anisotropy was due mainly to a magnetoelastic effect.This publication has 11 references indexed in Scilit:
- Magnetic properties and crystal structures of sputtered CoFe films.Journal of the Magnetics Society of Japan, 1989
- Magnetic properties of Fe-Co thin films deposited by ion beam sputtering.Journal of the Magnetics Society of Japan, 1986
- Magnetic properties of iron thin films evaporated at oblique incidenceJournal of Magnetism and Magnetic Materials, 1984
- Planar inductorIEEE Transactions on Magnetics, 1984
- Oblique incidence effects in evaporated iron thin filmsJournal of Magnetism and Magnetic Materials, 1983
- Magnetic properties of sputtered Ni–Fe and Fe–Co alloy lasersJournal of Applied Physics, 1972
- Anisotropy in Permalloy Films Evaporated at Grazing IncidenceJournal of Applied Physics, 1961
- Oblique-Incidence Anisotropy in Evaporated Permalloy FilmsJournal of Applied Physics, 1960
- Anisotropy in Permalloy FilmsJournal of Applied Physics, 1959
- A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X-Ray SpectrometerJournal of Applied Physics, 1949