X-ray reflectivity and adsorption isotherm study of fractal scaling in vapor-deposited films
- 9 December 1991
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 67 (24) , 3408-3411
- https://doi.org/10.1103/physrevlett.67.3408
Abstract
We have carried out x-ray reflectivity and adsorption measurements on thermally evaporated silver and gold films deposited onto substrates held at 80, 300, and 500 K to investigate whether the surfaces of such films are fractal in nature. Both techniques indicate self-affine fractal scaling for Ag films deposited at near-normal incidence onto substrates held at 80 K.Keywords
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