Charge Coupled Devices (CCDS) For X-Ray Spectroscopy Applications

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Abstract
The X-ray performance of two new types of GEC P8600 CCDs have been measured. One, a conventional thin depletion layer device, possesses very low noise characteristics enabling good X-ray energy resolution to be achieved, but with only modest quantum efficiency (10% at 5.9 keV). The other, a deep depletion device fabricated on high resistivity silicon also possesses the desired low noise performance (8 electrons rms), combined with much improved quantum efficiencies (60% at 5.9 keV). Degradation of energy resolution due to charge spreading effects has also been overcome through use of the deep depletion layer and the new device has a capability for rejection of background charged particles of around 96%. The development is for spectroscopic instrumentation for X-ray astronomy.© (1986) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

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