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New method for calibration of permeation wafer and diffusion devices
Home
Publications
New method for calibration of permeation wafer and diffusion devices
New method for calibration of permeation wafer and diffusion devices
RD
Russell N. Dietz
Russell N. Dietz
EC
Edgar A. Cote
Edgar A. Cote
JS
James D. Smith
James D. Smith
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1 February 1974
journal article
Published by
American Chemical Society (ACS)
in
Analytical Chemistry
Vol. 46
(2)
,
315-318
https://doi.org/10.1021/ac60338a006
Abstract
No abstract available
Cited
Cited by 8 articles
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