Double tilt heating specimen holder for surface imaging by reflection electron microscopy using an EM 300 Philips microscope
- 1 March 1985
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 56 (3) , 418-420
- https://doi.org/10.1063/1.1138315
Abstract
A new type of heating specimen holder which allows reflection electron microscopy (REM) imaging with incident and azimuthal angle control is described. A REM image is presented, from a bulk specimen whose surface was prepared in situ, and shows strong contrasts due to atomic steps.Keywords
This publication has 5 references indexed in Scilit:
- Observation en microscopie électronique de la croissance d'oxydes sur une surface de siliciumJournal of Crystal Growth, 1983
- Direct observation of the phase transition between the (7 × 7) and (1 × 1) structures of clean (111) silicon surfacesSurface Science, 1981
- Image contrast of dislocations and atomic steps on (111) silicon surface in reflection electron microscopySurface Science, 1981
- Reflection electron microscopy of clean and gold deposited (111) silicon surfacesSurface Science, 1980
- Si(111) surface structures by glancing-incidence high-energy electron diffractionActa Crystallographica Section A, 1972