An investigation of the relations between the technological parameters, phase constitution and electrical characteristics of thick Pd-Ag resistive films
- 30 September 1973
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 17 (3) , 345-361
- https://doi.org/10.1016/0040-6090(73)90142-9
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Stability of palladium oxide resistive glaze filmsMicroelectronics Reliability, 1967
- The structure of PdOActa Crystallographica, 1953