Analysis of data from an optical atom probe
- 1 March 1994
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 76-77, 409-415
- https://doi.org/10.1016/0169-4332(94)90374-3
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Implementation of the optical atom probeSurface Science, 1992
- New dimensions in atom-probe analysisSurface Science, 1992
- Channel electron multipliers: quantitative intensity measurement—efficiency, gain, linearity and bias effectsJournal of Electron Spectroscopy and Related Phenomena, 1990
- Application of a position-sensitive detector to atom probe microanalysisReview of Scientific Instruments, 1988