Thermal properties of lanthanum modified lead zirconate titanate (PLZT), lithium niobate and lithium tantalate
- 1 January 1988
- journal article
- research article
- Published by Taylor & Francis in Ferroelectrics
- Vol. 77 (1) , 153-160
- https://doi.org/10.1080/00150198808223238
Abstract
Fabrication of optical information processing chips involves a lot of thermal processing with silicon and electro-optic material. The information of thermal properties becomes important in this technology. Thermal conductivity, thermal diffusivity and specific heat of ceramic lanthanum modified lead zirconate titanate (PLZT), single crystal lithium tantalate (LiTaO3) and lithium niobate (LiNbO3) have been measured. Measurements were made over various temperature ranges (up to 400°C). The techniques used to make the measurements are described. Comparison is made to available data.Keywords
This publication has 6 references indexed in Scilit:
- Silicon photodetector integrated on a lithium tantalate substrateApplied Physics Letters, 1984
- Simple apparatus for the measurement of thermal diffusivity between 80–500 K using the modified Ångström methodReview of Scientific Instruments, 1980
- Integrated optical half adder circuitApplied Optics, 1979
- Apparatus for the measurement of thermal diffusivity featuring a low-frequency sine-wave generator and a digital phase meterJournal of Physics E: Scientific Instruments, 1978
- Bragg switch for optical channel waveguidesApplied Physics Letters, 1978
- Thermal DiffusivityPublished by Springer Nature ,1973