Capacitance-voltage characteristics of alternating-current thin-film electroluminescent devices
- 7 May 1990
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 56 (19) , 1889-1891
- https://doi.org/10.1063/1.103078
Abstract
The capacitance-voltage (C-V) technique is proposed as a method for characterization of the electrical properties of alternating-current thin-film electroluminescent (ACTFEL) display devices. Analysis of the C-V and aging characteristics of ZnS:Mn ACTFEL devices indicates that the C-V technique is complementary to the charge-voltage technique in the extraction of device physics information.Keywords
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