Si nanowire growth with ultrahigh vacuum scanning tunneling microscopy
- 7 April 1997
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 70 (14) , 1852-1854
- https://doi.org/10.1063/1.118711
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Characterization and Application of Materials Grown by Electron-Beam-Induced DepositionJapanese Journal of Applied Physics, 1994
- Deposition and subsequent removal of single Si atoms on the Si(111)-7×7 surface by a scanning tunneling microscopeJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1994
- Field-Induced Nanometer- to Atomic-Scale Manipulation of Silicon Surfaces with the STMScience, 1991
- Atomic emission from a gold scanning-tunneling-microscope tipPhysical Review Letters, 1990
- Fundamental aspects of VLS growthJournal of Crystal Growth, 1975
- Gold silicon phase diagramSolid-State Electronics, 1967