Development of Energy-Independent Film Badges With Multi-Element Filters

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Abstract
This paper describes the development of two film badges whose response per roentgen is constant over a wide range of X- and gamma-ray energies. The lead-lattice film badge contains a multi-element filter (0.013 g/cm2 gadolinium, 0.085 g/cm2 erbium, 0.100 g/cm2 tantalum, 0.138 g/cm2 gold and 0.081 g/cm2 bismuth) and a copper fluorescent absorber whose thickness varies with the film type. The response of Du Pont 502, 508 and 555; Eastman Type II; and Ilford PM-1 films in this badge is flat within 30 per cent from 50 to 1250 keV. The badge is directionally dependent, and the density under the filter is uniform. The lead-frame film badge contains a multi-element filter (0.128 g/cm2 gadolinium, 0.129 g/cm2 erbium, 0.114 g/cm2 tantalum, 0.117 g/cm2 gold and 0.074 g/cm2 bismuth) and a 0.02 in.-thick copper fluorescent absorber. The response of the films listed above is flat within 30 per cent from 40 to 1250 keV. The badge is directionally independent within 30 per cent, but the density under the filter at low energies is nonuniform, the edges being darker than the central area. The badges were modified to permit the evaluation of thermal-neutron and beta-radiation exposures. A method was devised for measuring thermal neutrons using two multi-element filters having similar photon responses.

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