8. A specimen-exchange device for an ultra-high vacuum atom-probe field-ion microscope
- 31 December 1978
- Vol. 28 (12) , 543-545
- https://doi.org/10.1016/0042-207x(78)90009-x
Abstract
No abstract availableThis publication has 17 references indexed in Scilit:
- Morphology and chemistry of internally nitrided Fe-3at.% MoActa Metallurgica, 1978
- Effect of annealing on the surface composition of stainless steel 410Journal of Vacuum Science and Technology, 1974
- An FIM-atom probe study of the precipitation of copper from lron-1.4 at. pct copper. Part II: Atom probe analysesMetallurgical Transactions, 1973
- An FIM-atom probe study of the precipitation of copper from lron-1.4 at. pct copper. Part I: Field-ion microscopyMetallurgical Transactions, 1973
- Field-ion atom probe analysisSurface Science, 1973
- Some Applications of Field-Ion Atom-Probe Analysis to Iron and SteelsMetal Science Journal, 1973
- FIM-atom probe analysis of thin nitride platelets in Fe-3 at.% MoScripta Metallurgica, 1971
- Atom-probe FIM analysis of the interaction of the imaging gas with the surfaceSurface Science, 1970
- Field adsorption and desorption of helium and neonSurface Science, 1969
- The Atom-Probe Field Ion MicroscopeReview of Scientific Instruments, 1968