A radioactive technique for the continuous measurement of film thickness in vacuum deposited gold films
- 31 January 1962
- journal article
- Published by Elsevier in The International Journal of Applied Radiation and Isotopes
- Vol. 13 (1) , 19-in2
- https://doi.org/10.1016/0020-708x(62)90163-1
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Instrument for recording the resistance during the deposition of a thin filmJournal of Scientific Instruments, 1960
- A Tracer Method for the Thickness Measurement of Thin Bi FilmsReview of Scientific Instruments, 1952
- A torsion balance for weighing evaporated filmsJournal of Scientific Instruments, 1952
- Die Untersuchung dünner absorbierender Schichten mit Hilfe der absoluten PhaseThe European Physical Journal A, 1951
- CONTINUOUS OBSERVATIONS WITH THE ELECTRON MICROSCOPE ON THE FORMATION OF EVAPORATED FILMS OF SILVER, GOLD, AND TINCanadian Journal of Research, 1950
- Oriented arrangements of thin aluminium films formed on ionic substratesDiscussions of the Faraday Society, 1949
- Über optische Konstanten, elektrischen Widerstand und Struktur dünner MetallschichtenAnnalen der Physik, 1938
- XII. Colours in metal glasses and in metallic filmsPhilosophical Transactions of the Royal Society A, 1904
- X. The Bakerian Lecture. —Experimental relations of gold (and other metals) to lightPhilosophical Transactions of the Royal Society of London, 1857