Abstract
The contribution of γ-ray scattering to the total efficiency for point-source geometries in a γ spectrometer was measured. Scattering of γ-rays on the shield and in the sample was considered. For a 25% efficiency detector in a small shield, about a 1% contribution to the total efficiency was measured, whereas for samples of a few hundred grams, these contributions reached 1–2%. Simple models for description of the effects are presented.

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