Methods of calculating resolution in electron microscopy: Scherzer's equation, circles of least confusion and the intensity distribution approach
- 2 November 1992
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 47 (1-3) , 241-255
- https://doi.org/10.1016/0304-3991(92)90200-4
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Emission microscopy and related techniques: Resolution in photoelectron microscopy, low energy electron microscopy and mirror electron microscopyUltramicroscopy, 1992
- The resolution of photoelectron microscopes with UV, X-ray, and synchrotron excitation sourcesUltramicroscopy, 1989
- A closer look at the effect of lens aberrations and object size on the intensity distribution and resolution in electron opticsJournal of Applied Physics, 1988
- The Theoretical Resolution Limit of the Electron MicroscopeJournal of Applied Physics, 1949