Abstract
Photoemission oscillations are observed from (001) GaAs, AlAs, AlGaAs, InAs, and AlSb. The periodicity of the oscillations corresponds to that of reflection high-energy electron diffraction oscillations measured using the same growth conditions. For both methods, the oscillation amplitude is strongly dependent on the substrate temperature, III/V flux ratio, and the nature of the surface on which growth is nucleated for the oscillation measurement.

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