Photoemission from Amorphous Selenium
- 1 July 1970
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 41 (8) , 3227-3229
- https://doi.org/10.1063/1.1659404
Abstract
Photoemission yield measurements were made on amorphous selenium from about 6 to 21 eV. The yield curve exhibits a change in slope at about 7.8 eV corresponding to a maximum in the imaginary dielectric constant. The photoemission threshold is obtained by using a threshold law equation derived by Kane, Y = C (E − Et)n, where Y is the yield, E and Et are the photon energy and threshold energy, and C and n are constants. The yield data up to 8 eV are best represented by the equation with resulting in an extrapolated photoemission threshold of 5.86 eV for amrophous selenium.
This publication has 6 references indexed in Scilit:
- Optical Properties of Amorphous Selenium in the Vacuum UltravioletJournal of the Optical Society of America, 1968
- Optical Properties of Vacuum-Evaporated Selenium and TelluriumJournal of Applied Physics, 1968
- Metal Photocathodes as Secondary Standards for Absolute Intensity Measurements in the Vacuum Ultraviolet*Journal of the Optical Society of America, 1966
- Photoemission from Amorphous and Metallic Selenium in the Vacuum Ultraviolet*Journal of the Optical Society of America, 1965
- Absolute Intensity Measurements in the Vacuum Ultraviolet*†Journal of the Optical Society of America, 1964
- Theory of Photoelectric Emission from SemiconductorsPhysical Review B, 1962