The Influence of Surface Finish and Metallization on Electrode Electromigration in Alpha-Quartz During Sweeping
- 1 January 1986
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 115-120
- https://doi.org/10.1109/freq.1986.200930
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Direct observation of impurity motion in quartz using the Raman effectJournal of Physics and Chemistry of Solids, 1970
- The 3000–3900 cm−1 absorption bands and anelasticity in crystalline α-quartzJournal of Physics and Chemistry of Solids, 1965
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