Smectic-layer growth at solid interfaces
- 30 April 1990
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 64 (18) , 2160-2163
- https://doi.org/10.1103/physrevlett.64.2160
Abstract
X-ray reflectivity is used to study the temperature-dependent smectic layering of the cyanobiphenyl compounds (nCB) in the isotropic phase at alkylsilane-coated silicon surfaces. Layer-by-layer growth is observed for 11CB and 12CB. Comparison of the layering transition temperatures with measurements at the vapor interface is used to determine the relative anchoring strengths at the two interfaces.Keywords
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