Circuit for testing high-efficiency IMPATT diodes

1 January 1967

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE

Vol. 55 (11) , 2065-2066
https://doi.org/10.1109/PROC.1967.6077

Abstract

A high-performance IMPATT diode test circuit has been developed which is very effective in reducing spurious oscillations. In this circuit, a 6-GHz germanium diode has been tested at 12.1-percent CW efficiency and 0.620-watt output.

Keywords

CIRCUIT TESTING
DIODES
TUNING
CIRCUIT OPTIMIZATION
ELECTRIC BREAKDOWN
INSERTION LOSS
HEAT SINKS
WATER HEATING
CURRENT DENSITY
LABORATORIES