Scaling of the (√3 × √3 )R30° domain-size distribution with coverage for Ag/Si(111)

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Abstract
The evolution of the (√3 × √3 )R30° domain-size distribution with coverage for Ag on Si(111) has been studied by high-resolution low-energy electron diffraction. Scaling of the size distribution, which can be fitted by a gamma distribution, is observed. A temperature dependence of the exponent n describing a power growth law for mean size versus coverage is found where n decreases with decreasing deposition temperature. By introducing a simple relation, q+nd=1, where the dimensionality d=2 and q is an exponent describing the power law for domain density versus coverage, the behavior of n is explained in terms of the experimentally observed behavior of q.