A New Low Energy Electron Microscope
- 1 December 1998
- journal article
- Published by World Scientific Pub Co Pte Ltd in Surface Review and Letters
- Vol. 5 (6) , 1189-1197
- https://doi.org/10.1142/s0218625x98001523
Abstract
Low energy electron microscopy (LEEM) has developed into one of the premier techniques for in situ studies of surface dynamical processes, such as epitaxial growth, phase transitions, chemisorption and strain relaxation phenomena. Over the last three years we have designed and constructed a new LEEM instrument, aimed at improved resolution, improved diffraction capabilities and greater ease of operation compared to present instruments.Keywords
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