X-Ray-Induced Structural Changes in Erythrocyte Membranes Studied by Use of Fluorescent Probes
- 1 July 1978
- journal article
- research article
- Published by JSTOR in Radiation Research
- Vol. 75 (1) , 31-45
- https://doi.org/10.2307/3574866
Abstract
Structural changes in [sheep] erythrocyte membranes caused by X-irradiation were investigated with the aid of fluorescent probes. The fluorescence intensity of 1-anilino-8-naphthalene sulfonate (ANS) combined with X-irradiated membranes apparently decreased as a function of the dose. The effect was observed even when 100 R was given. Lowering of the quantum yield of ANS fluorescence in irradiated membranes seemed to be the primary cause of the fluorescence decrease, since the amount of bound ANS was only slightly decreased. Fluorescence decrease was not accompanied by a significant shift of the emission spectrum to a longer wavelength. The fluorescence polarization of bound ANS decreased in X-irradiated membranes, suggesting that the decrease in quantum yield of bound ANS may be due to decrease in membrane microviscosity. Measurement of fluorescence polarization of 1,6-diphenyl-1,3,5-hexatriene incorporated into the membranes indicated that it also decreased with increasing X-ray doses. Changes in dynamic properties of erythrocyte membranes caused by X-irradiation were of erythrocyte membrane structure.This publication has 7 references indexed in Scilit:
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