Modeling the image quality of enhanced reflectance x-ray multilayers as a surface power spectral density filter function
- 1 July 1995
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 34 (19) , 3715-3726
- https://doi.org/10.1364/ao.34.003715
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
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