High temperature polarization retention of a Pb(Zr0.52Ti0.48)O3/YBa2Cu3O7−x memory cell

16 September 1996

journal article
Published by AIP Publishing in Applied Physics Letters

Vol. 69 (12) , 1789-1791
https://doi.org/10.1063/1.117487

Abstract

Polarization retention for Au/Pb(Zr0.52Ti0.48)O3/YBa2Cu3O7−x ferroelectric capacitors has been studied at elevated temperatures. A device with an effective area of 4×10−3 cm2 and 1 μm thickness was fabricated, and its retention measured at 150 °C and 200 °C. The retention was studied for two polarization directions in Pb(Zr0.52Ti0.48)O3 (PZT) by the pyroelectric current and phase detection method as well as by the conventional double pulse method. A polarization degradation of less than 5.5% was detected for PZT at 200 °C for more than 24 h.

Keywords

LEAD TITANATES
LEAD ZIRCONATES
HIGH−TC SUPERCONDUCTORS
YTTRIUM OXIDES
BARIUM OXIDES
COPPER OXIDES
FERROELECTRIC MATERIALS
POLARIZATION
HETEROSTRUCTURES
PYROELECTRIC MATERIALS
THIN FILMS
MEMORY DEVICES

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