Characterisation and Defects in Silicon Carbide

• 1 April 2002
• journal article
• Published by Trans Tech Publications, Ltd. in Materials Science Forum
• Vol. 389-393, 9-14
• https://doi.org/10.4028/www.scientific.net/msf.389-393.9

Abstract

Keywords

• CARRIER LIFETIME
• DEFECT
• DISLOCATION
• STACKING FAULT