Mismatch simulation for layout sensitive parameters of IC components and devices

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Vol. 8 (2) , 101-107
https://doi.org/10.1109/43.21828

Abstract

A compact Monte-Carlo-based universal procedure is presented that allows the estimation and qualification of geometrical arrangements and matching strategies, especially in monolithic devices. On the basis of a simple circuit example, the general structure of the main algorithm is explained, and some extensions are discussed. Experimental results on different configurations illustrate the broad application range

Keywords

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