Infrared ellipsometric study of SiO2 films: relationship between LO mode frequency and porosity
- 1 December 2000
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 377-378, 57-61
- https://doi.org/10.1016/s0040-6090(00)01386-9
Abstract
No abstract availableKeywords
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