Optical performance of integrated 1.5 μm grating wavelength-demultiplexer on InP-based waveguide

12 October 1989

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 25 (21) , 1441-1442
https://doi.org/10.1049/el:19890963

Abstract

The performance of a monolithic spectrometer operating by total internal reflection of a slab-guided mode from vertical dry-etched mirrors is reported. Device outputs are almost diffraction-limited and exhibit a signal-to-noise ratio of 15–20 dB. Losses for the collimating mirrors and the grating are 2 and 2.5 dB, respectively.

Keywords

INP SUBSTRATE
WDM
WAVELENGTH-DEMULTIPLEXER
SINGLE-MODED WAVEGUIDE
INTEGRATED GRATING
INP-BASED WAVEGUIDE
SLAB-GUIDED MODE
EPITAXIAL GROWTH
15 TO 20 DB
VERTICAL DRY-ETCHED MIRRORS
GAINASP-INP
1.5 MICRON
MONOLITHIC SPECTROMETER
LOSSES
III-V SEMICONDUCTORS
COLLIMATING MIRRORS
TOTAL INTERNAL REFLECTION
2.5 DB
2 DB

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