Etch decoration—scanning electron microscopy technique for measuring carbon gasification rates

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Abstract
Transmission electron microscopy has been used for some important discoveries underlying gas-carbon reaction kinetics. This technique requires cleavage of the sample to about 700 Å thickness. This study demonstrates that the same results by TEM can also be obtained by a much easier technique using scanning electron microscopy. Furthermore, the SEM technique is applicable to uncleavable materials and provides additional microscopic information on the surface.