Recombination Yield of H+2 Emergent from Ultra Thin Carbon Films below the Bohr Velocity
- 1 February 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 26 (1) , 1395-1397
- https://doi.org/10.1109/tns.1979.4330396
Abstract
We have used the University of Chicago Scanning Transmission Ion Microscope to measure the yield of H+2 from beams traversing 15 Å to 40 Å carbon films. At 12.5 keV/H the measured yields were about 1 to 10%. Analysis of the yields of H+2 from this experiment and other experiments at higher energy in terms of the rms internuclear separation of the emergent particles and the dwell time in the carbon film shows that the separation is the more important factor. Graphs of yields vs. internuclear separation provide hints about the mechanism of recombination of H+2.Keywords
This publication has 9 references indexed in Scilit:
- Recombination Yield of H+2 Emergent from Ultra Thin Carbon Films below the Bohr VelocityIEEE Transactions on Nuclear Science, 1979
- Observation of MeV DissociativeIons Emerging from Very Thin FoilsPhysical Review Letters, 1978
- Experimental Method for Testing the Potential of Moving Ions in SolidsPhysical Review Letters, 1978
- Nonequilibrium effects in the proton neutral fraction emerging from solids bombarded with MeV , , , and beamsPhysical Review A, 1977
- The dependence of H2+ molecular-ion yields on the proton neutral fractionNuclear Instruments and Methods, 1976
- Evidence for an Alignment Effect in the Motion of Swift Ion Clusters through SolidsPhysical Review Letters, 1975
- Scanning transmission ion microscope with a field ion source.Proceedings of the National Academy of Sciences, 1975
- Energy Loss of Swift Proton Clusters in SolidsPhysical Review Letters, 1974
- Dissociation of a fast H+2 molecular ion beam colliding with thin carbon targetsPhysics Letters A, 1971