Self-interstitials and the 935 cm−1 band in silicon
- 28 August 1989
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 55 (9) , 870-872
- https://doi.org/10.1063/1.101625
Abstract
Substitutional carbon in Czochralski Si is found to decrease the formation rate for a 935 cm−1 infrared absorption band under neutron irradiation while that for a 965 cm−1 band (interstitial carbon trapped at interstitial oxygen) increases. The observations support a controversial previous assignment of the 935 cm−1 band to a center with interstitial Si trapped by interstitial oxygen.Keywords
This publication has 4 references indexed in Scilit:
- Carbon-related radiation damage centres in Czochralski siliconJournal of Physics C: Solid State Physics, 1986
- On the Complex of the Oxygen Interstitial and the Silicon Interstitial in SiliconPhysica Status Solidi (a), 1984
- EPR of aSi interstitial complex in irradiated siliconPhysical Review B, 1976
- 1.8-, 3.3-, and 3.9-μ Bands in Irradiated Silicon: Correlations with the DivacancyPhysical Review B, 1966