Optically detected magnetic resonance studies of intrinsic defects in 6H-SiC
- 1 December 1999
- journal article
- Published by IOP Publishing in Semiconductor Science and Technology
- Vol. 14 (12) , 1141-1146
- https://doi.org/10.1088/0268-1242/14/12/323
Abstract
No abstract availableKeywords
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