Surface X-ray diffraction
- 1 May 1992
- journal article
- Published by IOP Publishing in Reports on Progress in Physics
- Vol. 55 (5) , 599-651
- https://doi.org/10.1088/0034-4885/55/5/002
Abstract
A general introduction to X-ray diffraction and its application to the study of surfaces and interfaces is presented. The application of X-ray diffraction to various problems in surface and interface science is illustrated through five different techniques: crystal truncation rod analysis; two-dimensional crystallography; three-dimensional structure analysis; the evanescent wave method; and lineshape analysis. These techniques are explained with numerous examples from experiments and with the aid of an extensive bibliography.Keywords
This publication has 136 references indexed in Scilit:
- Structure determination of Cu(100)-p(2×2)-S using x-ray diffractionPhysical Review B, 1990
- Reexamination of the InSb(111) and GaSb(111) structures: Comment on ‘disorder in the reconstructed (111)2×2 surfaces of InSb and GaSb’ BY A. Belzner, E. Ritter and H. SchulzSurface Science, 1989
- Surface structure and long-range order of the Ge(111)-c(2×8) reconstructionPhysical Review B, 1988
- Absolute x-ray reflectivity study of the Au(100) surfacePhysical Review B, 1988
- Multilayer reconstruction of the W(001) surfacePhysical Review B, 1988
- X-ray interference method for studying interface structuresPhysical Review B, 1988
- Structure Factor Determination in Surface X-ray DiffractionAustralian Journal of Physics, 1988
- Grazing incidence diffraction of X-rays at a Si single crystal surface: Comparison of theory and experimentZeitschrift für Physik B Condensed Matter, 1987
- Depth-Controlled Grazing-Incidence Diffraction of Synchrotron X RadiationPhysical Review Letters, 1986
- Critical surface scattering of x-rays at grazing anglesZeitschrift für Physik B Condensed Matter, 1984