Depth information in Auger electron spectroscopy
- 30 April 1985
- journal article
- Published by Elsevier in Surface Science
- Vol. 152-153, 957-962
- https://doi.org/10.1016/0039-6028(85)90510-2
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- An important step in quantitative auger analysis: The use of peak to background ratioSurface Science, 1984
- Concentration depth profiles by XPS; A new approachSurface Science, 1983
- Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solidsSurface and Interface Analysis, 1979
- Distinction between adsorbed monolayers and thicker layers in Auger electron spectroscopyJournal of Physics F: Metal Physics, 1973