Characterization of adsorbed protein films by time of flight secondary ion mass spectrometry
- 5 December 2001
- journal article
- research article
- Published by Wiley in Journal of Biomedical Materials Research
- Vol. 57 (3) , 432-440
- https://doi.org/10.1002/1097-4636(20011205)57:3<432::aid-jbm1186>3.0.co;2-g
Abstract
Time of flight secondary ion mass spectrometry (ToF-SIMS) is a useful technique in the study of adsorbed protein films because of its high surface sensitivity and chemical selectivity. However, the protein mass spectra generated by ToF-SIMS are complex fragmentation patterns of a polymer consisting of 20 different monomers (i.e., amino acids). Principal component analysis (PCA) was implemented to classify several reference positive ion protein spectra according to protein and substrate type. Furthermore, the positive ion 74/102 and 120/130 SIMS intensity ratios, radiolabeled experiments, and PCA were used to track the relative surface concentrations of bovine serum albumin and bovine fibronectin in a binary adsorption experiment. In all cases, the combination of ToF-SIMS and PCA proved capable in classifying proteins by their type (in the case of pure protein spectra) and relative surface concentration (in the case of the binary protein spectra). © 2001 John Wiley & Sons, Inc. J Biomed Mater Res 57: 432–440, 2001Keywords
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