Substrate testing of film heads
- 1 November 1981
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 17 (6) , 2896-2898
- https://doi.org/10.1109/tmag.1981.1061629
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Analysis of the efficiency and inductance of multiturn thin film magnetic recording headIEEE Transactions on Magnetics, 1978
- Finite element analysis of the vertical multi-turn thin-film headIEEE Transactions on Magnetics, 1978
- Combined thin film magnetoresistive read, inductive write headsIEEE Transactions on Magnetics, 1976