A deterministic approach to adjacency testing for delay faults

1 January 1989

proceedings article
Published by Association for Computing Machinery (ACM)

p. 351-356
https://doi.org/10.1145/74382.74441

Abstract

Adjacency testing for delay faults is examined in both theory and implementation. We shall show that the necessary and sufficient conditions for adjacency testability yield an efficient method of robust delay test generation. Empirical results (including several different cost measurements) are presented which demonstrate that our technique: (1) achieves high fault coverages under both the robust and nonrobust delay fault models and (2) is cost effective.

Keywords

SUFFICIENT CONDITION
EMPIRICAL RESULT
HIGH FAULT COVERAGE
ADJACENCY TESTING
DETERMINISTIC APPROACH
DELAY FAULT
EFFICIENT METHOD
NONROBUST DELAY FAULT MODEL
DIFFERENT COST MEASUREMENT
ADJACENCY TESTABILITY
ROBUST DELAY TEST GENERATION
FAULT MODEL
COST EFFECTIVENESS
PROPAGATION DELAY
FAULT DETECTION
FAULT COVERAGE
HAZARDS
ROBUSTNESS

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